A convolutional approach to reflection symmetry

September 17, 2016 Β· Declared Dead Β· πŸ› Pattern Recognition Letters

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Authors Marcelo Cicconet, Vighnesh Birodkar, Mads Lund, Michael Werman, Davi Geiger arXiv ID 1609.05257 Category cs.CV: Computer Vision Citations 36 Venue Pattern Recognition Letters Last Checked 6 months ago
Abstract
We present a convolutional approach to reflection symmetry detection in 2D. Our model, built on the products of complex-valued wavelet convolutions, simplifies previous edge-based pairwise methods. Being parameter-centered, as opposed to feature-centered, it has certain computational advantages when the object sizes are known a priori, as demonstrated in an ellipse detection application. The method outperforms the best-performing algorithm on the CVPR 2013 Symmetry Detection Competition Database in the single-symmetry case. Code and a new database for 2D symmetry detection is available.
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